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Low Magnification Calibration Ruler 0.2 N/m Beam current of the SEM

SKU: 82575519594

4.7
USD171.70 USD204.70

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Description

Beam current of the SEM should not exceed 2 nA

and development of precisionmetrology methods

ighter dimensional specifications for improved probe to probe consistency

Tapping Mode AFM Probe

15305 may be used for bulk specimens (left) or metallurgical mounts (right)

Low Magnification Calibration Ruler 0.2 N/m Beam current of the SEMDESCRIPTION 100 markings, divisions 0. 01mm on disc Calibration ruler on 1 8" (3. 2mm) nickel plated copper disc. 1mm long scale with 100 markings, with 0. 01mm divisions with an accuracy of + 0. 0005mm or better. Available unmounted, or mounted on SEM mounts. PELCO Technical Notes, SEM Low Magnification Ruler Disc (275KB PDF) See information on mounts A R

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