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and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs
5 times that of an uncoated probe
Silicon n-type <100> calibration structure
The MRS-6 is offered as a certified reference material (a traceable standard) or
Precision cutting tweezers for fine wire in electronics and thin film research
Maxtaform Style H7 TipChecker and Surface Potential Microscopy (SPoM)DESCRIPTION Maxtaform Style H7 Mesh: 400 Pitch: 63 microns Hole: 51 microns Bar Width: 12 microns Transmission: 65% Maxtaform Reference Finder Grids, Style H7, 400 mesh, Copper, 100 vial Maxtaform Reference Finder Grids, Style H7, 400 mesh, Nickel, 100 vial Reference Finder Grids for Transmission Electron Microscopy A selection of TEM grids with reference patterns to enable relocating a particular grid area. Theses grids are known as reference,
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