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100 nm Z step height X & Y Axis
025 Ωcm Antimony (n) doped Si Cantilever Thickness (Nom): 2 Cantilever Thickness (RNG): 1
The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2
Requires specialized probe holder model VITA-CH-MM
Tip Geometry: High Aspect Ratio Tip Height: 10 - 15 Front Angle: 5 ± 0
RESP-10 Auto Probes 100 nm Z step height0. 1N m, 10kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker's flagship RESP probes are the preferred choice for high sensitivity silicon probe imaging in contact mode in air. Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic
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