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TEM 4 Grid Holder for SEM AFM Imaging and Property Mapping Probes Prod # Description Style Length

SKU: 1075738138

4.6
USD211.10 USD235.10

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Description

Prod # Description Style Length Metal Points - Width x Thickness 5367-7G PELCO® Pro Gold Plated Curved

Screw used is 2-56 x 1/4 Hex Soc

10mm  5326 DUMONT Electronic

5 Tip Set Back( RNG): 0 - 3

TRmode cantilever holders include dual piezos to oscillate the tip rotationally or vertically

TEM 4 Grid Holder for SEM AFM Imaging and Property Mapping Probes Prod # Description Style LengthDESCRIPTION SEM Pin Mount Specimen Holdersfor Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Exchange/Return Notes
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